Nathan C. Flanders (Argonne National Laboratory): Next-Generation Synchrotron Techniques for Quantum Materials

2F Seminar Room, Science Knot Building

Abstract

X-rays provide the powerful capability for characterizing materials due to their wavelengths being on the atomic scale, offering unique insights into atomic structure. While traditional x-ray characterization techniques excel at resolving crystallographic and electronic structure, the advent of fourth-generation (Gen IV) synchrotrons has unlocked a new suite of coherent characterization methodologies. These laterally coherent beams deliver novel insights into heterogeneous structures and dynamics, addressing critical bottlenecks in next-generation materials science. Here, we review these advanced developments and present a specific case study tracking the heterogeneous structural changes following photoexcitation in the 2D quantum material tungsten diselenide.

Zoom information

https://us02web.zoom.us/j/2022111100

(Meeting code: 2022111100 Password: skcm2)

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