Yoshiaki Sugimoto (Tokyo University): High-resolution observation and manipulation of single atoms, molecules, and spins using atomic force microscopy

Atomic force microscopy (AFM) has established itself as an indispensable analytical technique in surface science. AFM operates by bringing a sharp tip into close proximity with a sample surface and measuring the forces acting upon it. These forces are detected by monitoring the deflection of a force sensor, such as a cantilever. Taking advantage of its ability to achieve high resolution in various environments—including vacuum, air, and liquid—regardless of the sample’s conductivity, AFM has been applied to a wide range of research fields.

In particular, AFM under ultra-high vacuum conditions enables the observation and manipulation of various materials at the atomic level. This presentation will introduce our recent work on structural analysis, single-molecule mechanochemistry, and single-spin imaging using AFM. For structural analysis, we will discuss studies on diamond, natural organic matter, and physisorbed CO molecules. Regarding single-molecule mechanochemistry, we will present the mechanochemical reactions of single molecules induced by the AFM tip. Finally, for spin imaging, we will show the visualization of spin-induced lattice distortions in a physisorbed oxygen molecule system and a spin cycloid magnetic structure in an Fe nanowire.

Zoom Information:

https://us02web.zoom.us/j/2022111100

(Meeting code: 2022111100 Password: skcm2)